Microelectronics Failure Analysis


Microelectronics Failure Analysis pdf

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Microelectronics Failure Analysis


Microelectronics Failure Analysis

Author: EDFAS Desk Reference Committee

language: en

Publisher: ASM International

Release Date: 2011


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Includes bibliographical references and index.

Microelectronic Failure Analysis Desk Reference


Microelectronic Failure Analysis Desk Reference

Author:

language: en

Publisher: ASM International

Release Date: 2001-01-01


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Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.

Microelectronic Failure Analysis


Microelectronic Failure Analysis

Author: Richard J. Ross

language: en

Publisher: ASM International(OH)

Release Date: 1999


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Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth ed