Microelectronic Failure Analysis Techniques


Microelectronic Failure Analysis Techniques pdf

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Microelectronic Failure Analysis Techniques


Microelectronic Failure Analysis Techniques

Author: Ed Doyle (Jr.)

language: en

Publisher:

Release Date: 1981*


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Microelectronic Failure Analysis Desk Reference


Microelectronic Failure Analysis Desk Reference

Author:

language: en

Publisher: ASM International

Release Date: 2001-01-01


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Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.

Microelectronics Failure Analysis Techniques


Microelectronics Failure Analysis Techniques

Author: General Electric Company, Electronics Laboratory

language: en

Publisher:

Release Date: 1980


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The objective of this procedural guide was not to present an expose of device failure modes/mechanisms and applicable techniques for detection, identification and measurement but rather to provide a treatise on proven failure analysis techniques, equipment, procedures and expected analytical results. The guide thus represents a compilation and description of practical semiconductor failure analysis techniques rather than failure analysis flow sequences for verifying specific device failure mechanisms. (Author).