Microelectronics Failure Analysis Techniques
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Microelectronics Failure Analysis Techniques
Author: General Electric Company, Electronics Laboratory
language: en
Publisher:
Release Date: 1980
The objective of this procedural guide was not to present an expose of device failure modes/mechanisms and applicable techniques for detection, identification and measurement but rather to provide a treatise on proven failure analysis techniques, equipment, procedures and expected analytical results. The guide thus represents a compilation and description of practical semiconductor failure analysis techniques rather than failure analysis flow sequences for verifying specific device failure mechanisms. (Author).
Microelectronic Failure Analysis Desk Reference
Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.